Browsing by Author "Tiryaki, Erhan"
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An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet
Tiryaki, Erhan; Kocahan, Özlem; Özder, Serhat (Sciendo, 2021)The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm ... -
Quantitative Phase Imaging of Thin Film Surface
Tiryaki, Erhan; Kocahan, O.; Özder, Serhat (Polish Acad Sciences Inst Physics, 2021)In this study, the white light diffraction phase microscopy and the generalized Morse wavelet are proposed to achieve practical and precise measurement of a thin film surface. The white light diffraction phase microscopy ...